Common acronyms in microscopy
Encyclopedia : C : CO : COM : Common acronyms in microscopy
Introduction
This list is outdated. Technological status of 1997.Abreviations
- AAS Atomic Absorption Spectroscopy
- ACF absorption correction factor
- ADC analog to digital converter
- AED Atomic Emission Detector
- AEM analytical electron microscope/microscopy
- AES Atomic Emission Spectroscopy
- AES Auger electron spectroscopy
- AFM atomic force microscopy
- AFS Atomic Fluorescence Spectroscopy
- APSTM Analytical Photon Scanning Tunneling Microscope
- ATW atmospheric thin window
- BSE backscattered electron
- BSED backscattered electron diffraction
- BSEI backscattered electron image/imaging
- CB coherent bremsstrahlung
- CBIM convergent-beam imaging
- CCD charge-coupled device
- CFEG cold field-emission gun
- CL condenser lens
- CL cathodoluminescence
- CRT cathode-ray tube
- CTEM Conventional Transmission Electron Microscopy
- DP Diffraction Pattern
- DSTEM dedicated scanning transmission electron microscopy
- EBIC electron beam-induced current
- EBSD electron backscatter diffraction
- ECD Electron Capture Detector
- EDAX Energy Dispersive Analysis of X-rays
- EDS Energy Dispersive X-ray Spectroscopy
- EDX Energy Dispersive X-ray Analysis
- EDXF Enery Dispersive X-ray Fluorescence
- EELS electron energy-loss spectrometry/spectroscopy
- EFTEM energy filtering transmission electron microscope
- EI Electron Impact
- EM Electron Microscopy
- EMMA electron microscope microanalyzer
- EMP electron microprobe
- EMPA electron microprobe analysis
- EMS electron microscopy image simulation
- EPASA Electron Probe Analysis Society of America
- EPMA electron probe microanalyzer
- EPMA electron probe micro analysis
- EPMA electron probe microanalysis
- ESCA electron spectroscopy for chemical analysis
- ESD Electron Stimulated Desorption
- ESEM Environmental Scanning Electron Microscopy
- ESI electron spectroscopic imaging
- ESR Electron Spin Resonance
- FA Fluorescence Analysis
- FCF fluorescence correction factor
- FEG field emission gun
- FEM Field Emission Electron Microscopy
- FET field effect transistor
- FFEM Freeze-Fracture Electron Microscopy
- FFT fast Fourier transform
- FIM field ion microscopy
- FSE fast secondary electron
- FWHM full width at half maximum
- FWTM full width at tenth maximum
- GB grain boundary
- GCS generalized cross section
- HPGe high purity Germanium detector
- HREM high resolution electron microscope
- HRTEM high-resolution transmission electron microscope/microscopy
- HV high vacuum
- HVEM high voltage electron microscope/microscopy
- ICP Inductively Coupled Plasma
- IR infrared spectroscopy
- IVEM intermediate voltage electron microscope/microscopy
- JEOL Japanese Electron Optics Laboratory
- KAP potassium acid phthalate
- LDE1 Layered Dispertion Element 1
- LDE2 Layered Dispertion Element 2
- LEED low-energy electron diffraction
- LEEM Low Energy Electron Microscopy
- LIF Lithium Fluoride
- LM light microscopy
- LOD Limit Of Detection
- MAC mass absorption coefficient
- MAS Microbeam Analysis Society
- MCA multichannel analyzer
- MDM minimum detectable mass
- MEEM Metastable Electron Emission Microscopy
- MEM Mirror Electron Microscopy
- MLS multiple least squares fit
- MMF minimum mass fraction
- MS Mass Spectroscopy
- MTXM Magnetic Transmission X-ray Microscopy
- NAA Neutron Activation Analysis
- NIST National Institute of Standards and Technology
- nm nanometer
- NMR Nuclear Magnetic Resonance
- NPD Nitrogen-Phosphorous Detector
- OBHIC Optical Beam Heat Induced Current
- OBIC Optical Beam Induced Current
- OBIRCH Optical Beam Induced Resistance Change
- OES Optical Emission Spectroscopy
- P/B peak-to-background ratio
- PAP Pouchou and Pichoir
- PB phase boundary
- PB Particle Beam
- PEELS parallel electron energy-loss spectroscopy
- PEEM Photoemission Electron Microscopy
- PES Photoelectron Spectroscopy
- PET Pentaerythritol
- PLI Photoluminescence Imaging
- PMT photomultiplier tube
- ppb parts per billion
- ppm parts per million
- QE quantum efficiency
- RAP rubidum acid phthalate ratemeter
- REM reflection electron microscope/microscopy
- RHEED reflection high-energy electron diffraction
- S/N signal-to-noise ratio
- SAD selected-area diffraction
- SAED selected area electron diffraction
- SAM scanning Auger microscopy/microprobe
- SAXS Small-Angle X-ray Scattering
- SCL Spectrally Resolved Cathodoluminescence
- SE secondary electron
- SEELS serial electron energy-loss spectrometer/spectrometry
- SEM scanning electron microscope/microscopy
- SESM scanning electron spectrometric spectroscopy
- Si(Li) Lithium drifted silicon
- SIMS secondary ion mass spectrometry/spectroscopy
- SPEEM Scanning Photoemission Electron Microscopy
- SPELEEM Spectroscopic Photoemission and Low Energy Electron Microscopy
- SPEM Scanning Photoelectron Microscopy
- SPM Scanning Probe Microscopy
- SRM standard reference material
- STEM scanning transmission electron microscope/microscopy
- STM scanning tunneling microscope/microscopy
- STS Scanning Tunneling Spectroscopy
- STXM Scanning Transmission X-ray Microscopy
- TAP Thallium Acid Phthalate
- TB twin boundary
- TED Transmission Electron Diffraction
- TED Thermionic Emission Detector
- TEM transmission electron microscope/microscopy
- TLE Thin Layer Electrode
- TOF-MS Time-Of-Flight Mass Spectrometry
- TXM Transmission X-ray Microscopy
- UHV ultrahigh vacuum
- UTW ultra thin window
- VLM visible-light microscope/microscopy
- WDS wavelength-dispersive
- WDX wavelength dispersive X-ray spectroscopy
- XANES X-ray absorption near-edge spectroscopy
- XANES X-ray absorption near-edge structure
- XEDS X-ray energy-dispersive
- XPEEM X-ray Photoemission Electron Microscopy
- XPLEEM X-ray Photoemission and Low Energy Electron Microscopy
- XPS X-ray photoelectron spectroscopy
- XRD X-ray diffraction
- XRF X-ray Fluorescence
- ZAF atomic number, absorption, fluorescence correction
See also
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