List of materials analysis methods

Encyclopedia : L : LI : LIS : List of materials analysis methods

AED - Auger electron diffraction
AES - Auger electron spectroscopy
APS - Appearance potential spectroscopy
CL - Cathodoluminescence
DVS - Dynamic vapour sorption
EBSD - Electron backscatter diffraction
EID - Electron induced desorption
EMP - Electron microprobe analysis
ESCA - Electron spectroscopy for chemical analysis; see XPS
ESD - Electron stimulated desorption
FEM - Field emission microscopy
FIM-AP - field ion microscopy-Atom probe
FTIR - Fourier transform infrared absorption spectroscopy; e.g., ATR (Attenuated Total Reflection), GI (Grazing Incidence), DRIFTS (Diffuse Reflectance)
GDMS - Glow discharge mass spectrometry
GDOS - Glow discharge optical spectroscopy
GISAXS - Grazing Incidence Small Angle X-ray Scattering
GIXD - Grazing Incidence X-ray Diffraction
HAS - Helium atom scattering
HREELS - High resolution electron energy loss spectroscopy
IAES - Ion induced Auger electron spectroscopy
IGA - Intelligent gravimetric analysis
IIX - Ion induced X-ray analysis
INS - Ion neutralization spectroscopy
IRS - Infra Red spectroscopy
ISS - Ion scattering spectroscopy
LEED - Low energy electron diffraction
LEEM - Low energy electron microscopy
LIBS - Laser induced breakdown spectroscopy
LOES - Laser optical emission spectroscopy
LS - Light (Raman) scattering
NEXAFS - Near edge X-ray absorption fine structure
PD - Photodesorption
PDEIS - Potentiodynamic electrochemical impedance spectroscopy
PED - Photoelectron diffraction (also called XPD, PhD, ARPEFS)
PIXE - Particle (or proton) induced X-ray spectroscopy
RBS - Rutherford back-scattering spectroscopy
REM - Reflection electron microscopy
RHEED - Reflection high energy electron diffraction
SAXS - Small Angle X-ray Scattering
SCANIIR - Surface composition by analysis of neutral species and ion-impact radiation
SE - Spetroscopic ellipsometry
SEIRA -Surface enhanced infrared absorption spectroscopy
SEM - Scanning electron microscopy
SEXAFS - Surface extended X-ray absorption fine structure
SIMS - Secondary ion mass spectrometry
SNMS - Sputtered neutral species mass spectroscopy
SNOM - Scanning Near-Field Optical Microscopy
SPM - Scanning probe microscopy
UPS - UV-photoelectron spectroscopy
WAXS - Wide Angle X-ray Scattering
XAES - X-ray induced Auger electron spectroscopy
X-CTR - X-ray crystal truncation rod scattering
XDS - X-ray diffuse scattering
XPEEM - X-ray photoelectron emission microscopy
XPS - X-ray photoelectron spectroscopy
XR - X-ray reflectivity
XRF - X-ray fluorescence analysis

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