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Scanning probe microscopy

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Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position. SPM was founded with the invention of the scanning tunneling microscope in 1981.
Many scanning probe microscopes can image several interactions simultaneously. The manner of using these interactions to obtain an image is generally called a mode.

Established types of scanning probe microscopy

AFM, atomic force microscopy
* contact AFM
* non-contact AFM
* dynamic contact AFM
EFM, electrostatic force microscope
FMM, force modulation microscopy
KPFM, kelvin probe force microscopy
MFM, magnetic force microscopy
MRFM, magnetic resonance force microscopy
NSOM, near-field scanning optical microscopy, or SNOM, scanning near-field optical microscopy
PSTM, photon scanning tunneling microscopy
SCM, scanning capacitance microscopy
SGM, scanning gate microscopy
SThM, [scanning thermal microscopy
STM, scanning tunneling microscopy
SVM, scanning voltage microscopy

Advantages of scanning probe microscopy

Disadvantages of scanning probe microscopy

Programs

References

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External links

 


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